Adsorption of thin isobutane films on silicon investigated by X-ray reflectivity measurements

Thin Solid Films

Volumn 515, Issue 14 SPEC. ISS., 2007, Pages 5660-5663

  Shokuie, Kaveh ^a   Paulus, Michael ^a   Sternemann, Christian ^a   Fendt, Robert ^a   Tolan, Metin ^a  

^a TU DORTMUND UNIVERSITY   (Germany)

Author keywords

Adsorption; Thin films; X ray reflectivity; X ray scattering

Indexed keywords

ADSORPTION; INTERFACES (MATERIALS); SILICON WAFERS; THICKNESS MEASUREMENT; X RAY SCATTERING;

HAMAKER CONSTANT; THIN ISOBUTANE FILMS; X-RAY REFLECTIVITY;

THIN FILMS;

EID: 34247139277     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.12.006     Document Type: Article

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