Analysis of results from x-ray magnetic reflectometry for magnetic multilayer systems

Physical Review B - Condensed Matter and Materials Physics

Volumn 75, Issue 14, 2007, Pages

  Fahnle M ^a   Steiauf, D ^a   Martosiswoyo, L ^a   Goering, E ^a   Bruck S ^a   Schutz G ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34247159044     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.75.144415     Document Type: Article

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