The structure of the water-propane interface investigated by x-ray reflectivity measurements

Surface and Interface Analysis

Volumn 40, Issue 8, 2008, Pages 1226-1230

  Paulus, Michael ^a   Gutt, Christian ^b   Tolan, Metin ^a  

^a TU DORTMUND UNIVERSITY   (Germany)

^b DESY   (Germany)

Author keywords

Adsorption; Gas liquid interface; X ray reflectivity

Indexed keywords

ADSORPTION; DEWATERING; MOLECULAR BEAM EPITAXY; PROPANE; REFLECTION; SURFACE CHEMISTRY; SURFACE PROPERTIES; SURFACE ROUGHNESS; SURFACE TENSION; THICK FILMS; X RAY DIFFRACTION;

BULK LIQUIDS; BULK VALUES; CAPILLARY WAVE FLUCTUATIONS; ELECTRON DENSITIES; GAS-LIQUID INTERFACE; HAMAKER CONSTANTS; LAYER THICKNESSES; LIFSHITZ THEORY; MODIFIED MODEL; THIN FILMS; THIN LAYERING; VERTICAL STRUCTURES; WATER SURFACES; X-RAY REFLECTIVITY; X-RAY REFLECTIVITY MEASUREMENTS;

PHASE INTERFACES;

EID: 49749101260     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2851     Document Type: Article

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