Interfacial melting of ice in contact With SiO2

Physical Review Letters

Volumn 92, Issue 20, 2004, Pages

  Engemann, S ^a   Reichert, H ^a   Dosch, H ^a,b   Bilgram, J ^c   Honkimaki V ^d   Snigirev, A ^d  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b UNIVERSITY OF STUTTGART   (Germany)

^c ETH ZURICH   (Switzerland)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; ICE; INTERFACES (MATERIALS); MELTING; PHASE TRANSITIONS; RECRYSTALLIZATION (METALLURGY); SYNCHROTRON RADIATION; THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS;

HIGH-DENSITY AMORPHOUS (HDA); LOW-DENSITY AMORPHOUS (LDA) ICE; LOW-DENSITY LIQUID PHASE (LDL); PARABOLIC REFRACTIVE LENSES;

SILICA;

EID: 9744281507     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.92.205701     Document Type: Article

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