-
1
-
-
84944485155
-
The theory of p-n junctions in semiconductors and p-n junction transistors
-
W. Shockly, "The theory of p-n junctions in semiconductors and p-n junction transistors," Bell Syst. Tech. J, vol. 28, no. 3, pp. 435-489, 1949.
-
(1949)
Bell Syst. Tech. J
, vol.28
, Issue.3
, pp. 435-489
-
-
Shockly, W.1
-
2
-
-
4344658558
-
Ultrahigh-quality silicon carbide single crystals
-
Aug
-
D. Nakamura, I. Gunjishima, S. Yamaguchi, T. Ito, A. Okamoto, H. Kondo, S. Onda, and K. Takatori, "Ultrahigh-quality silicon carbide single crystals," Nature, vol. 430, no. 7003, pp. 1009-1012, Aug. 2004.
-
(2004)
Nature
, vol.430
, Issue.7003
, pp. 1009-1012
-
-
Nakamura, D.1
Gunjishima, I.2
Yamaguchi, S.3
Ito, T.4
Okamoto, A.5
Kondo, H.6
Onda, S.7
Takatori, K.8
-
3
-
-
4043056609
-
2, 4H-SiC Power DMOSFETs
-
Aug
-
2, 4H-SiC Power DMOSFETs," IEEE Electron Device Lett., vol. 25, no. 8, pp. 556-558, Aug. 2004.
-
(2004)
IEEE Electron Device Lett
, vol.25
, Issue.8
, pp. 556-558
-
-
Ryu, S.1
Krishnaswami, S.2
O'Loughlin, M.3
Richmond, J.4
Agarwal, A.5
Palmour, J.6
Hefner, A.R.7
-
4
-
-
34247548849
-
10 kV, 5 A 4H-SiC power DMOSFET
-
S. Ryu, S. Krishnaswami, B. Hull, J. Richmond, A. Agarwal, and A. Hefner, "10 kV, 5 A 4H-SiC power DMOSFET," in Proc. ISPSD, 2006, pp. 265-268.
-
(2006)
Proc. ISPSD
, pp. 265-268
-
-
Ryu, S.1
Krishnaswami, S.2
Hull, B.3
Richmond, J.4
Agarwal, A.5
Hefner, A.6
-
5
-
-
0034449647
-
A review of the, RESURF technology
-
A. W. Ludikhuize, "A review of the, RESURF technology," in Proc. ISPSD, 2000, pp. 11-18.
-
(2000)
Proc. ISPSD
, pp. 11-18
-
-
Ludikhuize, A.W.1
-
6
-
-
0031251517
-
-
T. Fujihira, Theory of semiconductor superjunction devices, Jpn. J. Appl. Phys. 1, Regul. Rap. Short Notes, voi. 36, no. 10, pp. 6254-6262, Oct. 1997.
-
T. Fujihira, "Theory of semiconductor superjunction devices," Jpn. J. Appl. Phys. 1, Regul. Rap. Short Notes, voi. 36, no. 10, pp. 6254-6262, Oct. 1997.
-
-
-
-
7
-
-
36449002512
-
1-xN heterostructures grown by low-pressure metalorganic chemical vapor deposition
-
May
-
1-xN heterostructures grown by low-pressure metalorganic chemical vapor deposition," Appl. Phys. Lett., vol. 58, no. 21, pp. 2408-2410, May 1991.
-
(1991)
Appl. Phys. Lett
, vol.58
, Issue.21
, pp. 2408-2410
-
-
Khan, M.A.1
Hove, J.M.V.2
Kuzma, J.N.3
Olson, D.T.4
-
8
-
-
1042303439
-
1-xN heterojunctions
-
Jun
-
1-xN heterojunctions," Appl. Phys. Lett., vol. 60, no. 24, pp. 3027-3029, Jun. 1991.
-
(1991)
Appl. Phys. Lett
, vol.60
, Issue.24
, pp. 3027-3029
-
-
Khan, M.A.1
Kuznia, J.N.2
Hove, J.M.V.3
Pan, N.4
Carter, J.5
-
9
-
-
0001590229
-
Two-dimensional electron gases induced by spontaneous and piezoelectric polarization charges in N- and Ga-face, AlGaN/GaN heterostructures
-
Jan
-
O. Ambacher, J. Smart, J. R. Shealy, N. G. Weimann, K. Chu, M. Murphy, W. J. Schaff, L. F. Eastman, R. Dimitrov, L. Wittmer, M. Stutzmann, W. Rieger, and J. Hilsenbeck, "Two-dimensional electron gases induced by spontaneous and piezoelectric polarization charges in N- and Ga-face, AlGaN/GaN heterostructures," J. Appl. Phys., vol. 85, no. 1, p. 334, Jan. 1999.
-
(1999)
J. Appl. Phys
, vol.85
, Issue.1
, pp. 334
-
-
Ambacher, O.1
Smart, J.2
Shealy, J.R.3
Weimann, N.G.4
Chu, K.5
Murphy, M.6
Schaff, W.J.7
Eastman, L.F.8
Dimitrov, R.9
Wittmer, L.10
Stutzmann, M.11
Rieger, W.12
Hilsenbeck, J.13
-
10
-
-
0035279281
-
Application of GaN-based heterojunction FETs for advanced wireless communication
-
Mar
-
Y. Ohno and M. Kuzuhara, "Application of GaN-based heterojunction FETs for advanced wireless communication," IEEE Trans. Electron Devices vol. 48, no. 3, pp. 517-523, Mar. 2001.
-
(2001)
IEEE Trans. Electron Devices
, vol.48
, Issue.3
, pp. 517-523
-
-
Ohno, Y.1
Kuzuhara, M.2
-
11
-
-
17644445773
-
High power Tx/Rx switch IC using AlGaN/GaN HFETs
-
H. Ishida, Y. Hirose, T. Murata, A. Kanda, Y. Ikeda, T. Matsuno, K. Inoue, Y. Uemoto, T. Tanaka, T. Egawa, and D. Ueda, "High power Tx/Rx switch IC using AlGaN/GaN HFETs," in IEDM Tech. Dig., 2003, pp. 583-586.
-
(2003)
IEDM Tech. Dig
, pp. 583-586
-
-
Ishida, H.1
Hirose, Y.2
Murata, T.3
Kanda, A.4
Ikeda, Y.5
Matsuno, T.6
Inoue, K.7
Uemoto, Y.8
Tanaka, T.9
Egawa, T.10
Ueda, D.11
-
12
-
-
33745728936
-
Experimental and theoretical exammation of orientation effect on Piezoelectric charge at gate periphery in AlGaN/GaN HFETs
-
Jul
-
H. Ishida, T. Murata, M. Ishii, Y. Hirose, Y. Uemoto, T. Tanaka, and D. Ueda, "Experimental and theoretical exammation of orientation effect on Piezoelectric charge at gate periphery in AlGaN/GaN HFETs," IEEE Trans. Electron Devices, vol. 53, no. 7, pp. 1524-1529, Jul. 2006.
-
(2006)
IEEE Trans. Electron Devices
, vol.53
, Issue.7
, pp. 1524-1529
-
-
Ishida, H.1
Murata, T.2
Ishii, M.3
Hirose, Y.4
Uemoto, Y.5
Tanaka, T.6
Ueda, D.7
-
13
-
-
0032256580
-
Direct measurement of gate depletion in high breakdown (405 V) AlGaN/GaN heterostructure field effect transistors
-
R. Vetury, Y. R. Wu, R. T. Fini, G. Parish, S. Keller, S. P. DenBaars, and U. K. Mishra, "Direct measurement of gate depletion in high breakdown (405 V) AlGaN/GaN heterostructure field effect transistors," in IEDM Tech. Dig., 1998, pp. 55-58.
-
(1998)
IEDM Tech. Dig
, pp. 55-58
-
-
Vetury, R.1
Wu, Y.R.2
Fini, R.T.3
Parish, G.4
Keller, S.5
DenBaars, S.P.6
Mishra, U.K.7
-
14
-
-
33748483637
-
The 1.6 kV AlGaN/GaN HFETs
-
Sep
-
N. Lipirneni, A. Koudymov, V. Adivarhan, J. Yang, G. Simin, and M. A. Khan, "The 1.6 kV AlGaN/GaN HFETs," IEEE Electron Device Lett., vol. 27, no. 9, pp. 716--718, Sep. 2006.
-
(2006)
IEEE Electron Device Lett
, vol.27
, Issue.9
, pp. 716-718
-
-
Lipirneni, N.1
Koudymov, A.2
Adivarhan, V.3
Yang, J.4
Simin, G.5
Khan, M.A.6
-
15
-
-
33748509732
-
Highbreakdown voltage achieved on AlGaN/GaN HEMTs with integrated slant field plates
-
Sep
-
Y. Dora, A Chakraborly, L. McCarthy, S. Keller, S. P. DenBaars, and U. K. Mishra, "Highbreakdown voltage achieved on AlGaN/GaN HEMTs with integrated slant field plates," IEEE Electron Device Lett., vol. 27, no. 9, pp. 713--715, Sep. 2006.
-
(2006)
IEEE Electron Device Lett
, vol.27
, Issue.9
, pp. 713-715
-
-
Dora, Y.1
Chakraborly, A.2
McCarthy, L.3
Keller, S.4
DenBaars, S.P.5
Mishra, U.K.6
-
16
-
-
34548023634
-
Improved reverse blocking characteristics in AlGaN/GaN Schottky barrier diodes based on AlN template
-
Aug
-
M. Miyoshi, Y. Kuraoka, K. Asai, T. Shibata, M. Tanaka, and T. Egawa, "Improved reverse blocking characteristics in AlGaN/GaN Schottky barrier diodes based on AlN template," Electron. Lett., vol. 43, no. 17, pp. 953-954, Aug. 2007.
-
(2007)
Electron. Lett
, vol.43
, Issue.17
, pp. 953-954
-
-
Miyoshi, M.1
Kuraoka, Y.2
Asai, K.3
Shibata, T.4
Tanaka, M.5
Egawa, T.6
-
17
-
-
0036247890
-
Breakdown voltage, and reverse, recovery characteristics of free-standing GaN Schottky rectifiers
-
Jan
-
J. W. Johnson, A. P. Zhang, W. Luo, F. Ren, S. J. Pearton, S. S. Park, Y. J. Park, and J. Chyi, "Breakdown voltage, and reverse, recovery characteristics of free-standing GaN Schottky rectifiers," IEEE Trans. Electron Devices, vol. 49, no. 1, pp. 32-36, Jan. 2002.
-
(2002)
IEEE Trans. Electron Devices
, vol.49
, Issue.1
, pp. 32-36
-
-
Johnson, J.W.1
Zhang, A.P.2
Luo, W.3
Ren, F.4
Pearton, S.J.5
Park, S.S.6
Park, Y.J.7
Chyi, J.8
-
18
-
-
33750906811
-
Improvement of unipolar power device performance using a polarization junction
-
Nov
-
A. Nakajima, K. Adachi, M. Shimizu, and H. Okumura, "Improvement of unipolar power device performance using a polarization junction," Appl. Phys. Lett., vol. 89, no. 19, 193-501, Nov. 2006.
-
(2006)
Appl. Phys. Lett
, vol.89
, Issue.19
, pp. 193-501
-
-
Nakajima, A.1
Adachi, K.2
Shimizu, M.3
Okumura, H.4
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