A review of RESURF technology

IEEE International Symposium on Power Semiconductor Devices and ICs (ISPSD)

Volumn , Issue , 2000, Pages 11-18

  Ludikhuize, A W ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN; ELECTRIC RESISTANCE; INTEGRATED CIRCUIT LAYOUT; MOS DEVICES; NUMERICAL METHODS; RELIABILITY; SEMICONDUCTOR JUNCTIONS; SILICON ON INSULATOR TECHNOLOGY;

FIRST ORDER EQUATIONS; HIGH CURRENT EFFECTS; ON RESISTANCE DEVICES; REDUCED SURFACE FIELD TECHNOLOGY;

SEMICONDUCTOR DEVICE STRUCTURES;

EID: 0034449647     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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