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Volumn 36, Issue 10, 1997, Pages 6254-6262

Theory of semiconductor superjunction devices

Author keywords

Breakdown voltage; On resistance; Power device; Principle; Semiconductor device; Simulation; Superjunction; Theory

Indexed keywords

ELECTRIC BREAKDOWN OF SOLIDS; ELECTRIC RESISTANCE; POWER ELECTRONICS; SEMICONDUCTING FILMS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DOPING;

EID: 0031251517     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.36.6254     Document Type: Article
Times cited : (495)

References (15)
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    • D. J. Coe: Europe Patent 0053854 (1982).
    • (1982)
    • Coe, D.J.1
  • 7
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    • U.S. Patent 5216275
    • X. Chen: U.S. Patent 5216275 (1993).
    • (1993)
    • Chen, X.1
  • 8
    • 31544452702 scopus 로고
    • U.S. Patent 5438215
    • J. Tihanyi: U.S. Patent 5438215 (1995).
    • (1995)
    • Tihanyi, J.1
  • 9
    • 31544480819 scopus 로고    scopus 로고
    • Japan Patent pending [in Japanese]
    • T. Fujihira: Japan Patent pending [in Japanese].
    • Fujihira, T.1
  • 12
    • 31544436532 scopus 로고    scopus 로고
    • ISE Integrated Systems Engineering AG, Zurich, release 4, Pt. 14
    • ISE TCAD Manuals, (ISE Integrated Systems Engineering AG, Zurich, 1997) Vol. 5, release 4, Pt. 14, p. 14.1.
    • (1997) ISE TCAD Manuals , vol.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.