-
6
-
-
33750100541
-
-
L. Nyns L. Hall T. Conard A. Delabie W. Deweerd M. Heyns S. V. Elshocht N. V. Hoornick C. Vinckier S. D. Gendt J. Electrochem. Soc. 2006 153 9 F205
-
(2006)
J. Electrochem. Soc.
, vol.153
, Issue.9
, pp. 205
-
-
Nyns, L.1
Hall, L.2
Conard, T.3
Delabie, A.4
Deweerd, W.5
Heyns, M.6
Elshocht, S.V.7
Hoornick, N.V.8
Vinckier, C.9
Gendt, S.D.10
-
7
-
-
31644442136
-
-
P. D. Kirsch M. A. Quevedo-Lopez H. -J. Li Y. Senzaki J. J. Peterson S. C. Song S. A. Krishnan N. Moumen J. Barnett G. Bersuker P. Y. Hung B. H. Lee J. Appl. Phys. 2006 99 023508
-
(2006)
J. Appl. Phys.
, vol.99
, pp. 023508
-
-
Kirsch, P.D.1
Quevedo-Lopez, M.A.2
Li, Y.3
Senzaki, Y.4
Peterson, J.J.5
Song, S.C.6
Krishnan, S.A.7
Moumen, N.8
Barnett, J.9
Bersuker, G.10
Hung, P.Y.11
Lee, B.H.12
-
10
-
-
15744384552
-
-
X. Liu S. Ramanathan A. Longdergan A. Srivastava E. Lee T. E. Seidel J. T. Barton D. Pang R. G. Gordon J. Electrochem. Soc. 2005 152 3 G213
-
(2005)
J. Electrochem. Soc.
, vol.152
, Issue.3
, pp. 213
-
-
Liu, X.1
Ramanathan, S.2
Longdergan, A.3
Srivastava, A.4
Lee, E.5
Seidel, T.E.6
Barton, J.T.7
Pang, D.8
Gordon, R.G.9
-
12
-
-
54749109380
-
-
A. Soulet, L. Duquesne, G. Jursich, R. Inman, A. Misra, N. Blasco, C. Lachaud, Y. Marot, R. Prunier, M. Vautier, S. Anderson, P. Clancy and M. Havlicek, Semiconductor Fabtech, 2005, 27th edition, 10/5
-
Semiconductor Fabtech, 2005, 27th Edition, 10/5
-
-
Soulet, A.1
Duquesne, L.2
Jursich, G.3
Inman, R.4
Misra, A.5
Blasco, N.6
Lachaud, C.7
Marot, Y.8
Prunier, R.9
Vautier, M.10
Anderson, S.11
Clancy, P.12
Havlicek, M.13
-
15
-
-
0141633668
-
-
H. B. Park M. Cho J. Park S. W. Lee C. S. Hwang J.-P. Kim J.-H. Lee N.-I. Lee H.-K. Kang J.-C. Lee S.-J. Oh J. Appl. Phys. 2003 94 3641
-
(2003)
J. Appl. Phys.
, vol.94
, pp. 3641
-
-
Park, H.B.1
Cho, M.2
Park, J.3
Lee, S.W.4
Hwang, C.S.5
Kim, J.-P.6
Lee, J.-H.7
Lee, N.-I.8
Kang, H.-K.9
Lee, J.-C.10
Oh, S.-J.11
-
17
-
-
54749116871
-
-
Y.-G. Park, J.-H. Yeo, E.-A. Chung, K.-V. Im, Y.-S. Kim, S.-T. Kim and C.-Y. Yoo, US Pat., 2006, 0205198
-
(2006)
US Pat.
-
-
Park, Y.-G.1
Yeo, J.-H.2
Chung, E.-A.3
Im, K.-V.4
Kim, Y.-S.5
Kim, S.-T.6
Yoo, C.-Y.7
-
18
-
-
19944365539
-
-
Y. F. Loo R. O'Kane A. C. Jones H. C. Aspinall R. J. Potter P. R. Chalker J. F. Bickley S. Taylor L. M. Smith J. Mater. Chem. 2005 15 1896
-
(2005)
J. Mater. Chem.
, vol.15
, pp. 1896
-
-
Loo, Y.F.1
O'Kane, R.2
Jones, A.C.3
Aspinall, H.C.4
Potter, R.J.5
Chalker, P.R.6
Bickley, J.F.7
Taylor, S.8
Smith, L.M.9
-
19
-
-
1942420039
-
-
K. Kukli M. Ritala M. Leskelä T. Sajavaara J. Keinonen A. C. Jones J. L. Roberts Chem. Vap. Deposition 2003 9 6 315
-
(2003)
Chem. Vap. Deposition
, vol.9
, Issue.6
, pp. 315
-
-
Kukli, K.1
Ritala, M.2
Leskelä, M.3
Sajavaara, T.4
Keinonen, J.5
Jones, A.C.6
Roberts, J.L.7
-
23
-
-
34547159401
-
-
T. Watanabe S. Hoffmann-Eifert L. Yang A. Rüdiger C. Kügeler C. S. Hwang R. Waser J. Electrochem. Soc. 2007 154 6 G134
-
(2007)
J. Electrochem. Soc.
, vol.154
, Issue.6
, pp. 134
-
-
Watanabe, T.1
Hoffmann-Eifert, S.2
Yang, L.3
Rüdiger, A.4
Kügeler, C.5
Hwang, C.S.6
Waser, R.7
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