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Volumn 18, Issue 8, 2007, Pages

Japan AFM roadmap 2006

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE MODULATION; FREQUENCY MODULATION; IMAGING TECHNIQUES; TECHNOLOGICAL FORECASTING; VACUUM APPLICATIONS;

EID: 33947539745     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/18/8/084001     Document Type: Conference Paper
Times cited : (18)

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    • A dynamic PID controller for high-speed atomic force microscopy
    • Kodera N, Sakashita M and Ando T 2006 A dynamic PID controller for high-speed atomic force microscopy Rev. Sci. Instrum. 77 083704
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    • Kodera, N.1    Sakashita, M.2    Ando, T.3
  • 32
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    • Umeda, N.1    Ishizaki, S.2    Uwai, H.3
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    • Uchihashi T, Yamashita H and Ando T 2006 Fast phase imaging in liquids using a rapid scan atomic force microscope Appl. Phys. Lett. 89 at press
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    • Uchihashi, T.1    Yamashita, H.2    Ando, T.3
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    • A mechanical microscope: High-speed atomic force microscopy
    • Humphris A D L, Miles M J and Hobbs J K 2005 A mechanical microscope: High-speed atomic force microscopy Appl. Phys. Lett. 86 034106
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    • Atomic force microscopy for high speed imaging using cantilevers with an integrated actuator and sensor
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.