SCOPUS 정보 검색 플랫폼

Volumn 88, Issue 20, 2006, Pages

Direct tip-sample interaction force control for the dynamic mode atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

OSCILLATION AMPLITUDE; TAPPING CYCLE; TIP-SAMPLE INTERACTION FORCE; TOPOGRAPHY;

AMPLITUDE MODULATION; COMPUTER SIMULATION; DELAY CIRCUITS; FORCE CONTROL; MATHEMATICAL MODELS; OSCILLATIONS;

ATOMIC FORCE MICROSCOPY;

EID: 33646894999 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2203958 Document Type: Article

Times cited : (20)

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