Characterization and optimization of scan speed for tapping-mode atomic force microscopy

Review of Scientific Instruments

Volumn 73, Issue 8, 2002, Pages 2928-

  Sulchek, T ^a   Yaralioglu, G G ^a   Quate, C F ^a   Minne, S C ^b  

^a STANFORD UNIVERSITY   (United States)

^b NanoDevices   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036685792     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1488679     Document Type: Article

References (0)