Fundamental interface properties in OFETs: Bonding, structure and function of molecular adsorbate layers on solid surfaces

Physica Status Solidi (A) Applications and Materials Science

Volumn 205, Issue 3, 2008, Pages 511-525

  Soubatch, S ^a,b   Temirov, R ^a,b   Tautz, F S ^a,b  

^a JACOBS UNIVERSITY BREMEN   (Germany)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT PROPERTIES; ENERGY BAND DISPERSIONS; INTERFACE PROPERTIES; INTERFACE STRUCTURES; INTERMOLECULAR INTERACTIONS; KONDO PHYSICS; MAGNETIC; MOLECULAR ADSORBATES; MOLECULAR ENVIRONMENTS; MOLECULAR WIRES; NANOSCALE; ORGANIC FIELD EFFECT TRANSISTORS; ORGANIC/METAL INTERFACES; PHYSICAL EFFECTS; REAL DEVICES; SOLID SURFACES; THIN-FILMS; TRANSPORT PHYSICS;

ABS RESINS; ADSORBATES; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; FIELD EFFECT TRANSISTORS; MAGNETIC THIN FILMS; MOLECULES; NANOSTRUCTURES; NANOWIRES; PROBABILITY DENSITY FUNCTION; SURFACE STRUCTURE; THICK FILMS; WIRE;

STRUCTURAL PROPERTIES;

EID: 51649104399     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200723447     Document Type: Article

References (94)

1. P. V. Necliudov, M. S. Shur, D. J. Gundlach et al., Solid-State Electron. 47, 259 (2003).
2. A. Hepp, H. Heil, W. Weise et al., Phys. Rev. Lett. 91, 157406 (2003).
3. T. Muck, V. Wagner, U. Bass et al., Synth. Met. 146, 317 (2004).
4. J. R. Ostrick, A. Dodabalapur, L. Torsi et al., J. Appl. Phys. 81, 6804 (1997).
5. M. Kotani, K. Kakinuma, M. Yoshimura et al., Chem. Phys. 325, 160 (2006).
6. T. Muck, J. Fritz, and V. Wagner, Appl. Phys. Lett. 86, 232101 (2005).
7. D. Schlettwein, K. Hesse, H. Tada et al., Chem. Mater. 12, 989 (2000).
8. Z. Bao, A. J. Lovinger, and J. Brown, J. Am. Chem. Soc. 120, 207 (1998).
9. H. Moon, R. Zeis, E. J. Borkent et al., J. Am. Chem. Soc. 126, 15322 (2004).
10. J. Zaumseil, R. H. Friend, and H. Sirringhaus, Nature Mater. 5, 69 (2006).
11. S. Sachs, M. Paul, A. Schöll et al., Verhandlungen der DPG, Europhysics Conference Abstracts, Dresden, 2006, Vol. 30A.
12. K. Glöckler, C. Seidel, A. Soukopp et al., Surf. Sci. 405, 1 (1998).
13. E. Umbach, K. Glockler, and M. Sokolowski, Surf. Sci. 404, 20 (1998).
14. A. C. Hillier and M. D. Ward, Phys. Rev. B 54, 14037 (1996).
15. C. Seidel, C. Awater, X. D. Liu et al., Sur. Sci. 371, 123 (1997).
16. S. R. Forrest, Chem. Rev. 97, 1793 (1997).
17. S. R. Forrest, J. Phys.: Condens. Matter 15, S2599 (2003).
18. S. R. Forrest, M. L. Kaplan, P. H. Schmidt et al., Appl. Phys. Lett. 41, 90 (1982).
19. A. Schmidt, T. J. Schuerlein, G. E. Collins et al., J. Phys. Chem. 99, 11770 (1995).
20. S. K. M. Henze, O. Bauer, T. L. Lee et al., Surf. Sci. 601, 1566 (2007).
21. A. Kraft, R. Temirov, S. K. M. Henze et al., Phys. Rev. B 74, 041402(R) (2006).
22. L. Kilian, E. Umbach, and M. Sokolowski, Surf. Sci. 573, 359 (2004).
23. F. S. Tautz, M. Eremtchenko, J. A. Schaefer et al., Phys. Rev. B 65, 125405 (2002).
24. R. Temirov, S. Soubatch, A. Luican et al., Nature 444, 350 (2006).
25. R. Temirov, A. C. Lassise, F. Anders et al., arxiv.org/abs/cond-mat/ 0612036; Nanotechnology (in press).
26. F. S. Tautz, Prog. Surf. Sci. 82, 479 (2007).
27. M. Rohlfing, R. Temirov, and F. S. Tautz, Phys. Rev. B 76, 115421 (2007).
28. M. Eremtchenko, D. Bauer, J. A. Schaefer et al., New J. Phys. 6, 4 (2004).
29. L. Kilian, A. Hauschild, R. Temirov et al., submitted.
30. L. Kilian, University of Würzburg (2002).
31. A. Hauschild, K. Karki, B. C. C. Cowie et al., Phys. Rev. Lett. 95, 209602 (2005).
32. A. Hauschild, K. Karki, B. C. C. Cowie et al., Phys. Rev. Lett. 94, 036106 (2005).
33. N. Nicoara, E. Roman, J. M. Gomez-Rodriguez et al., Org. Electron. 7, 287 (2006).
34. O. Neucheva, R. Temirov, S. Soubatch, and F. S. Tautz, to be published.
35. D. M. Newns, Phys. Rev. 178, 1123 (1969).
36. J. K. Norskov, Rep. Prog. Phys. 53, 1253 (1990).
37. S. X. Du, H. J. Gao, C. Seidel et al., Phys. Rev. Lett. 97, 156105 (2006).
38. W. Ji, Z.-Y. Lu, and H. Gao, Phys. Rev. Lett. 97, 246101 (2006).
39. S. Picozzi, A. Pecchia, M. Gheorghe et al., Phys. Rev. B 68, 195309 (2003).
40. R. Rurali, N. Lorente, and P. Ordejon, Phys. Rev. Lett. 95 (2005).
41. M. Eremtchenko, D. Bauer, J. A. Schaefer et al., J. Mater. Res. 19, 2028 (2004).
42. S. Soubatch, R. Temirov, and F. S. Tautz, unpublished.
43. M. Scharnberg, J. Hu, J. Kanzow et al., Appl. Phys. Lett. 86, 024104 (2005).
44. M. Scharnberg, J. Hu, J. Kanzow et al., Defects and Diffusion Forum 237-240, 993 (2005).
45. D. Cahen, A. Kahn, and E. Umbach, Mater. Today 8, 32 (2005).
46. I. G. Hill, A. Kahn, J. Cornil et al., Chem. Phys. Lett. 317, 444 (2000).
47. K. Sugiyama, D. Yoshimura, T. Miyamae et al., J. Appl. Phys. 83, 4928 (1998).
48. K. Y. Kwon, K. L. Wong, G. Pawin et al., Phys. Rev. Lett. 95, 166101 (2005).
49. L. Bartels, B. V. Rao, and A. Liu, Chem. Phys. Lett. 385, 36 (2004).
50. L. Kilian, E. Umbach, and M. Sokolowski, Surf. Sci. 573, 359 (2004).
51. D. Käfer, L. Ruppel, and G. Witte, Phys. Rev. B 75, 085309 (2007).
52. F. S. Tautz, M. Eremtchenko, J. A. Schaefer et al., Surf. Sci. 502, 176 (2002).
53. X. Ma, H. L. Meyerheim, J. Barthel et al., Appl. Phys. Lett. 84, 4038 (2004).
54. O. D. Jurchescu, J. Baas, and T. T. M. Palstra, Appl. Phys. Lett. 84, 3061 (2004).
55. H. Klauk, M. Halik, U. Zschieschang et al., J. Appl. Phys. 92, 5259 (2002).
56. M. Yamada, I. Ikemoto, and H. Kuroda, Bull. Chem. Soc. Jpn. 61, 1057 (1988).
57. C. Goldmann, S. Haas, C. Krellner et al., J. Appl. Phys. 96, 2080 (2004).
58. L. Casalis, M. F. Danisman, B. Nickel et al., Phys. Rev. Lett. 90, 206101 (2003).
59. M. Eremtchenko, R. Temirov, D. Bauer et al., Phys. Rev. B 72, 115430 (2005).
60. D. Käfer and G. Witte, Chem. Phys. Lett. 442, 376 (2007).
61. A. Langner, A. Hauschild, S. Fahrenhoz et al., Surf. Sci. 574, 153 (2005).
62. R. B. Campbell and J. M. Robertson, Acta Crystallogr. 15, 289 (1962).
63. J. Robertson, J. Trotter, and V. C. Sinclair, Acta Crystallogr. 14, 697 (1961).
64. J. Baumgartl, R. P. A. Dullens, M. Dijkstra et al., Phys. Rev. Lett. 98, 198303 (2007).
65. L. Onsager, Ann. New York Acad. Sci. 51, 627 (1949).
66. I. P. M. Bouchoms, W. A. Schoonveld, J. Vrijmoeth et al., Synth. Met. 104, 175 (1999).
67. D. J. Gundlach, T. N. Jackson, D. G. Schlom et al., Appl. Phys. Lett. 74, 3302 (1999).
68. A. Langner, Y. Su, and M. Sokolowski, Phys. Rev. B 74, (2006).
69. S. Soubatch, R. Temirov, M. Weinhold et al., Surf. Sci. 600, 4679 (2006).
70. F. Garnier, R. Hajlaoui, A. El Kassmi et al., Chem. Mater. 10, 3334 (1998).
71. K. R. Amundson, H. E. Katz, and A. J. Lovinger, Thin Solid Films 426, 140 (2003).
72. J. Ackermann, C. Videlot, P. Raynal et al., Appl. Surf. Sci. 212, 26 (2003).
73. C. D. Dimitrakopoulos, B. K. Furman, T. Graham et al., Synth. Met. 92, 47 (1998).
74. F. Garnier, A. Yassar, R. Hajlaoui et al., J. Amer. Chem. Soc. 115, 8716 (1993).
75. S. Soubatch, R. Temirov, and F. S. Tautz, Langmuir 22, 9572 (2006).
76. G. Witte and C. Wöll, J. Mater. Res. 19, 1889 (2004).
77. R. Temirov and F. S. Tautz, unpublished.
78. N. Karl, Synth. Met. 133, 649 (2003).
79. Y. M. Sun, Y. Q. Liu, and D. B. Zhu, J. Mater. Chem. 15, 53 (2005).
80. G. Koller, S. Berkebile, M. Oehzelt et al., Science 317, 351 (2007).
81. H. Yamane, S. Kera, K. K. Okudaira et al., Phys. Rev. B 68, 033102 (2003).
82. H. Yamane, D. Yoshimura, E. Kawabe, R. Sumii, K. Kanai, Y. Ouchi, N. Ueno, and K. Seki, Phys. Rev. B 76, 165436 (2007).
83. H. H. Graen, M. Neuber, M. Neumann et al., Europhys. Lett. 12, 173 (1990).
84. F. P. Netzer, Vacuum 41, 49 (1990).
85. M. G. Ramsey, D. Steinmuller, F. P. Netzer et al., Surf. Sci. 251, 979 (1991).
86. N. Koch, A. Vollmer, I. Salzmann et al., Phys. Rev. Lett. 96, 156803 (2006).
87. C. Kergueris, J. P. Bourgoin, S. Palacin et al., Phys. Rev. B 59, 12505 (1999).
88. J. J. Parks, A. R. Champagne, G. R. Hutchison et al., arXiv:cond-mat/0610555v2.
89. M. A. Reed, C. Zhou, C. J. Muller et al., Science 278, 252 (1997).
90. C. Joachim and M. A. Ratner, Proc. Natl. Acad. Sci. USA 102, 8800 (2005).
91. A. Nitzan and M. A. Ratner, Science 300, 1384 (2003).
92. A. R. Champagne, A. N. Pasupathy, and D. C. Ralph, Nano Lett. 5, 305 (2005).
93. H. S. J. van der Zant, Y. V. Kervennic, M. Poot et al., Faraday Discuss. 131, 347 (2006).
94. M. Rohlfing, G. Cuniberti, and F. S. Tautz, to be published.