Radiotracer measurements as a sensitive tool for the detection of metal penetration in molecular-based organic electronics

Applied Physics Letters

Volumn 86, Issue 2, 2005, Pages

  Scharnberg, M ^a   Hu, J ^a   Kanzow, J ^a   Ratzke K ^a   Adelung, R ^a   Faupel, F ^a   Pannemann, C ^b   Hilleringmann, U ^b   Meyer, S ^c   Pflaum, J ^c  

^a UNIVERSITY OF KIEL   (Germany)

^b UNIVERSITY OF PADERBORN   (Germany)

^c UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FIELD EFFECT TRANSISTORS; FILM GROWTH; LIGHT SCATTERING; METALLIC GLASS; RADIOACTIVE TRACERS; SPUTTERING; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

MOLECULAR ELECTRONICS; ORGANIC ELECTRONICS; ORGANIC THIN FILMS; TOP CONTACT STRUCTURES (TOC);

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 19744383210     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1849845     Document Type: Article

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