SCOPUS 정보 검색 플랫폼

Synthetic Metals

Volumn 146, Issue 3, 2004, Pages 317-320

In situ electrical characterization of DH4T field-effect transistors

(6) Muck, T a Wagner, V a Bass, U b Leufgen, M b Geurts, J b Molenkamp, L W b

a JACOBS UNIVERSITY BREMEN (Germany)

b UNIVERSITY OF WÜRZBURG (Germany)

Author keywords

Dihexylquaterthiophene; Monolayers; Organic thin film transistors

Indexed keywords

DEPOSITION; ELECTRON MOBILITY; ELECTRON TRANSPORT PROPERTIES; FILM GROWTH; MONOLAYERS; SEMICONDUCTING ORGANIC COMPOUNDS; SMECTIC LIQUID CRYSTALS; THIN FILM TRANSISTORS;

DIHEXYLQUATERTHIOPHENE; ORGANIC THIN FILM TRANSISTORS (OTFT); SMECTIC MESOPHASE;

FIELD EFFECT TRANSISTORS;

EID: 9344226817 PISSN: 03796779 EISSN: None Source Type: Journal
DOI: 10.1016/j.synthmet.2004.08.010 Document Type: Conference Paper

Times cited : (89)

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