A simulator of small-delay faults caused by resistive-open defects

Proceedings - 13th IEEE European Test Symposium, ETS 2008

Volumn , Issue , 2008, Pages 113-118

  Czutro, Alejandro ^a   Houarche, Nicolas ^b   Engelke, Piet ^a   Polian, Ilia ^a   Comte, Mariane ^b   Renovell, Michel ^b   Becker, Bernd ^a  

^a UNIVERSITY OF FREIBURG   (Germany)

^b LIRMM   (France)

Author keywords

Bridging fault simulation; Probabilistic fault coverage; Resistive opens; Small delay defects

Indexed keywords

BRIDGING FAULT SIMULATION; DELAY FAULTS; PROBABILISTIC FAULT COVERAGE; RESISTIVE OPENS; SMALL-DELAY DEFECTS;

DEFECTS;

EID: 51549114242     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETS.2008.19     Document Type: Conference Paper

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