SCOPUS 정보 검색 플랫폼

Volumn 19, Issue 5, 2002, Pages 18-25

Resistance characterization for weak open defects

Author keywords

[No Author keywords available]

Indexed keywords

DELAY FAULT TESTS; INDUCTIVE FAULT ANALYSIS; YIELD EVALUATION MONITOR;

ELECTRIC RESISTANCE; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; PROCESS ENGINEERING; RELIABILITY THEORY;

CMOS INTEGRATED CIRCUITS;

EID: 0036732498 PISSN: 07407475 EISSN: None Source Type: Journal
DOI: 10.1109/MDT.2002.1033788 Document Type: Article

Times cited : (127)

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7
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9
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10
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.