Fault simulation of interconnect opens in digital CMOS circuits

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 1997, Pages 548-554

  Konuk, Haluk ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT OSCILLATIONS; COMPUTER SIMULATION; COMPUTER SOFTWARE; DIGITAL INTEGRATED CIRCUITS; ELECTRIC WIRING; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; VOLTAGE CONTROL;

INTERCONNECT OPENS; SOFTWARE PACKAGE SPICE; TRANSISTOR CHARGE EQUATIONS;

CMOS INTEGRATED CIRCUITS;

EID: 0031360690     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iccad.1997.643593     Document Type: Conference Paper

References (20)