Defective behaviours of resistive opens in interconnect lines

Proceedings of the 10th IEEE European Test Symposium, ETS 2005

Volumn 2005, Issue , 2005, Pages 28-33

  Arumí, Daniel ^a   Rodríguez Montañés, Rosa ^a   Figueras, Joan ^a  

^a UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CROSSTALK; DEFECTS; ELECTRIC RESISTANCE; LARGE SCALE SYSTEMS;

BUS STRUCTURE; INTERCONNECT LINES; OPEN DEFECTS; PREDICTION;

CMOS INTEGRATED CIRCUITS;

EID: 28444479615     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETS.2005.13     Document Type: Conference Paper

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