Testing for resistive opens and stuck opens

IEEE International Test Conference (TC)

Volumn , Issue , 2001, Pages 1049-1058

  Li, James C M ^a   Tseng, Chao Wen ^a   McCluskey, E J ^a  

^a Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FAULT CURRENTS; ELECTRIC POTENTIAL; MICROPROCESSOR CHIPS; RESISTORS;

RESISTIVE OPEN DEFECTS;

INTEGRATED CIRCUIT TESTING;

EID: 0035684844     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (26)

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