Observations of the spontaneous growth of tin whiskers in various reliability conditions

Proceedings - Electronic Components and Technology Conference

Volumn , Issue , 2008, Pages 1484-1490

  Han, Sung Won ^a   Kim, Kyung Seob ^b   Yu, Chung Hee ^c   Osterman, Michael ^a   Pecht, Michael ^a  

^a UNIVERSITY OF MARYLAND   (United States)

^b Yeojoo Institute of Technology   (South Korea)

^c Electronics and Telecommunications Research Institute (ETRI)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER NETWORKS; COPPER; CRYSTAL WHISKERS;

AMBIENT CONDITIONS; ELECTRONIC COMPONENTS; TIN WHISKERS;

TITANIUM COMPOUNDS;

EID: 51349083803     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2008.4550172     Document Type: Conference Paper

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