Tin whisker growth driven by electrical currents

Journal of Applied Physics

Volumn 95, Issue 12, 2004, Pages 7742-7747

  Liu, S H ^a   Chen, Chih ^a   Liu, P C ^b   Chou, T ^b  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b MACRONIX INTERNATIONAL CO LTD   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; CATHODES; CRYSTALLINE MATERIALS; ELECTRIC CURRENTS; ELECTROMIGRATION; METALLIC FILMS; SINGLE CRYSTALS; STRESSES; THERMAL EFFECTS; TIN; TITANIUM; TRANSMISSION ELECTRON MICROSCOPY;

BLECH STRUCTURES; MECHANICAL STRESSES; ROOM TEMPERATURE; TIN WHISKERS;

CRYSTAL WHISKERS;

EID: 3142567371     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1712019     Document Type: Article

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