Investigation of contact-force dependent effects in conductive atomic force microscopy on Si and GaAs

Journal of Applied Physics

Volumn 104, Issue 4, 2008, Pages

  Brezna, W ^a   Smoliner, J ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; MICROSCOPIC EXAMINATION; SCANNING PROBE MICROSCOPY; SCHOTTKY BARRIER DIODES; SEMICONDUCTING GALLIUM; SILICON;

CONDUCTIVE ATOMIC FORCE MICROSCOPY; PRESSURE COEFFICIENTS; SCHOTTKY BARRIER;

GALLIUM ALLOYS;

EID: 50849118131     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2964107     Document Type: Article

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