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Volumn 47, Issue 13, 2008, Pages

Residual stress in obliquely deposited MgF2 thin films

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; MICROSTRUCTURE; RESIDUAL STRESSES; RESISTIVE EVAPORATION; SUBSTRATES;

EID: 50849113154     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.47.00C266     Document Type: Article
Times cited : (19)

References (31)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.