A review of near-field laser ablation for high-resolution nanoscale surface analysis

Applied Spectroscopy Reviews

Volumn 43, Issue 2, 2008, Pages 93-110

  Cleveland, Danielle ^a   Michel, Robert G ^a  

^a UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

Direct solid sampling; High resolution; Laser ablation; Nanoscale analysis; Near field region; Resonant laser ablation; Surface characterization; Tip manufacture

Indexed keywords

LASER ABLATION; LASER APPLICATIONS; LASERS; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; OPTICAL VARIABLES MEASUREMENT; PULSED LASER DEPOSITION;

DIRECT SOLID SAMPLING; HIGH RESOLUTION; NANOSCALE ANALYSIS; NEAR-FIELD REGION; RESONANT LASER ABLATION; SURFACE CHARACTERIZATION; TIP MANUFACTURE;

SURFACE ANALYSIS;

EID: 50649099921     PISSN: 05704928     EISSN: 1520569X     Source Type: Journal    
DOI: 10.1080/05704920701829084     Document Type: Review

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