Spectroscopy with scanning near-field optical microscopy using photon tunnelling mode

Journal of Microscopy

Volumn 194, Issue 2-3, 1999, Pages 519-522

  Takahashi, S ^a   Futamata, M ^a   Kojima, I ^b  

^a JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

^b NATL INST OF MAT AND CHEM RES   (Japan)

Author keywords

Copper phthalocyanine; Photon tunnelling mode; Raman spectroscopy; Scanning near field optical microscopy

Indexed keywords

COPPER; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL DATA STORAGE; PHOTONS; PROBES; RAMAN SCATTERING; SURFACE SCATTERING;

ATTENUATED-TOTAL-REFLECTION; COPPER PHTHALOCYANINE; COPPER-PHTHALOCYANINE; EVANESCENT WAVE; OPTICAL FIBER PROBE; PHOTON TUNNELING; PHOTON TUNNELING MODE; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; TOTAL REFLECTION CONFIGURATION; TUNNELING MODES;

RAMAN SPECTROSCOPY;

COPPER; PHTHALOCYANINE;

ARGON LASER; CONFERENCE PAPER; DIODE LASER; GEOMETRY; MICROSCOPY; OPTICS; PHOTON; PRIORITY JOURNAL; RAMAN SPECTROMETRY; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SIGNAL DETECTION;

EID: 0033059083     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1999.00517.x     Document Type: Conference Paper

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