Optimized apertureless optical near-field probes with 15 nm optical resolution

Nanotechnology

Volumn 17, Issue 13, 2006, Pages 3105-3110

  Frey, H G ^a   Bolwien, C ^b   Brandenburg, A ^b   Ros, R ^a   Anselmetti, D ^a  

^a BIELEFELD UNIVERSITY   (Germany)

^b FRAUNHOFER INSTITUTE FOR PHYSICAL MEASUREMENT TECHNIQUES IPM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; DYES; ELECTRIC FIELDS; IMAGE ANALYSIS; LIGHTING; METALS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; OPTIMIZATION; POLARIZATION;

ELECTRIC FIELD INTENSITY; GLASS TIP; OPTICAL NEAR-FIELD PROBES; SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM);

PROBES;

EID: 33746584908     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/13/004     Document Type: Article

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