MOSFET modeling for 45nm and beyond

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Volumn , Issue , 2007, Pages 638-643

  Cao, Yu ^a   McAndrew, Colin ^b  

^a ARIZONA STATE UNIVERSITY   (United States)

^b FREESCALE SEMICONDUCTOR INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER-AIDED DESIGN; CRITICAL LINK; DEVICE STRUCTURES; HIGH-K GATE; INTERNATIONAL CONFERENCES; MOSFET MODELING; PHYSICAL EFFECTS; PROCESS VARIATIONS; PROXIMITY EFFECTS; SUPPLY VOLTAGES;

DESIGN; MODELS; POWDERS;

MOSFET DEVICES;

EID: 50249137789     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2007.4397337     Document Type: Conference Paper

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