Implications of proximity effects for analog design

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 2006, Pages 169-176

  Drennan, P G ^a   Kniffin, M L ^a   Locascio, D R ^a  

^a FREESCALE SEMICONDUCTOR INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GRADED CHANNELS; PROXIMITY EFFECTS;

COMPUTATIONAL COMPLEXITY; FAILURE ANALYSIS; INTEGRATED CIRCUIT LAYOUT;

ANALOG CIRCUITS;

EID: 39049131196     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CICC.2006.320869     Document Type: Conference Paper

References (12)

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