Fast statistical circuit analysis with finite-point based transistor model

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2007, Pages 1391-1396

  Chen, Min ^a   Zhao, Wei ^a   Liu, Frank ^b   Cao, Yu ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

^b IBM RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT SIMULATION; COMPUTATIONAL METHODS; CURRENT VOLTAGE CHARACTERISTICS; POLYNOMIALS; STATISTICAL METHODS; TRANSIENT ANALYSIS;

FINITE DATA POINTS; POLYNOMIAL FORMULAS;

TRANSISTORS;

EID: 34548356683     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2007.364492     Document Type: Conference Paper

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