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Volumn 78, Issue 5, 2008, Pages

Radiation damage formation in InP, InSb, GaAs, GaP, Ge, and Si due to fast ions

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EID: 50049128182     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.78.054111     Document Type: Article
Times cited : (98)

References (83)
  • 3
    • 30244575856 scopus 로고
    • REDSEI 1042-0150 10.1080/10420159308219701
    • D. Lesueur and A. Dunlop, Radiat. Eff. Defects Solids REDSEI 1042-0150 10.1080/10420159308219701 126, 163 (1993).
    • (1993) Radiat. Eff. Defects Solids , vol.126 , pp. 163
    • Lesueur, D.1    Dunlop, A.2
  • 4
    • 0031176335 scopus 로고    scopus 로고
    • RMEAEP 1350-4487 10.1016/S1350-4487(97)00016-4
    • D. A. Young, Radiat. Meas. RMEAEP 1350-4487 10.1016/S1350-4487(97)00016-4 27, 575 (1997).
    • (1997) Radiat. Meas. , vol.27 , pp. 575
    • Young, D.A.1
  • 5
    • 49049146407 scopus 로고
    • SUSCAS 0039-6028 10.1016/0039-6028(81)90396-4
    • Y. Kitazoe, N. Hiraoka, and Y. Yamamura, Surf. Sci. SUSCAS 0039-6028 10.1016/0039-6028(81)90396-4 111, 381 (1981).
    • (1981) Surf. Sci. , vol.111 , pp. 381
    • Kitazoe, Y.1    Hiraoka, N.2    Yamamura, Y.3
  • 6
    • 0001325021 scopus 로고
    • NIMRD9 0167-5087 10.1016/0029-554X(82)90575-4
    • Y. Yamamura, Nucl. Instrum. Methods Phys. Res. NIMRD9 0167-5087 10.1016/0029-554X(82)90575-4 194, 515 (1982).
    • (1982) Nucl. Instrum. Methods Phys. Res. , vol.194 , pp. 515
    • Yamamura, Y.1
  • 8
    • 0000262376 scopus 로고
    • RAEFBL 0033-7579 10.1080/00337578508222510
    • C. C. Watson and T. A. Tombrello, Radiat. Eff. RAEFBL 0033-7579 10.1080/00337578508222510 89, 263 (1985).
    • (1985) Radiat. Eff. , vol.89 , pp. 263
    • Watson, C.C.1    Tombrello, T.A.2
  • 9
    • 0000830818 scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.49.7299
    • P. Stampfli and K. H. Bennemann, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.49.7299 49, 7299 (1994).
    • (1994) Phys. Rev. B , vol.49 , pp. 7299
    • Stampfli, P.1    Bennemann, K.H.2
  • 10
    • 0001567762 scopus 로고    scopus 로고
    • NIMBEU 0168-583X 10.1016/0168-583X(96)80046-2
    • P. Stampfli, Nucl. Instrum. Methods Phys. Res. B NIMBEU 0168-583X 10.1016/0168-583X(96)80046-2 107, 138 (1996).
    • (1996) Nucl. Instrum. Methods Phys. Res. B , vol.107 , pp. 138
    • Stampfli, P.1
  • 11
    • 0000110093 scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.46.14362
    • M. Toulemonde, C. Dufour, and E. Paumier, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.46.14362 46, 14362 (1992).
    • (1992) Phys. Rev. B , vol.46 , pp. 14362
    • Toulemonde, M.1    Dufour, C.2    Paumier, E.3
  • 16
    • 34250928801 scopus 로고
    • ZEPYAA 0044-3328 10.1007/BF01328080
    • F. Dessauer, Z. Phys. ZEPYAA 0044-3328 10.1007/BF01328080 12, 38 (1923).
    • (1923) Z. Phys. , vol.12 , pp. 38
    • Dessauer, F.1
  • 26
    • 50049120446 scopus 로고    scopus 로고
    • D. W. Palmer, Properties of semiconductors (2006.02) at www.semiconductors.co.uk.
    • Palmer, D.W.1
  • 28
    • 0036404681 scopus 로고    scopus 로고
    • CRTEDF 0232-1300 10.1002/1521-4079(200210)37:10<1058::AID- CRAT1058>3.0.CO;2-J
    • O. Pätzold, B. Fischer, and A. Cröll, Cryst. Res. Technol. CRTEDF 0232-1300 10.1002/1521-4079(200210)37:10<1058::AID-CRAT1058>3.0. CO;2-J 37, 1058 (2002).
    • (2002) Cryst. Res. Technol. , vol.37 , pp. 1058
    • Pätzold, O.1    Fischer, B.2    Cröll, A.3
  • 30
    • 50049117400 scopus 로고    scopus 로고
    • Online archive on physical properties of semiconductors at
    • Online archive on physical properties of semiconductors at www.ioffe.ru/sva/nsm/semicond/index.html.
  • 32
    • 0000924626 scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.34.2470
    • B. Massarani and J. C. Bourgoin, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.34.2470 34, 2470 (1986).
    • (1986) Phys. Rev. B , vol.34 , pp. 2470
    • Massarani, B.1    Bourgoin, J.C.2
  • 33
    • 0010928183 scopus 로고
    • PHRVAO 0031-899X 10.1103/PhysRev.115.1125
    • L. W. Aukerman, Phys. Rev. PHRVAO 0031-899X 10.1103/PhysRev.115.1125 115, 1125 (1959).
    • (1959) Phys. Rev. , vol.115 , pp. 1125
    • Aukerman, L.W.1
  • 34
    • 28644443422 scopus 로고
    • ZEPYAA 0044-3328
    • R. Bäuerlein, Z. Phys. ZEPYAA 0044-3328 176, 198 (1963).
    • (1963) Z. Phys. , vol.176 , pp. 198
    • Bäuerlein, R.1
  • 35
  • 36
    • 21144448503 scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.29.1962
    • P. M. Mooney and J. C. Bourgoin, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.29.1962 29, 1962 (1984).
    • (1984) Phys. Rev. B , vol.29 , pp. 1962
    • Mooney, P.M.1    Bourgoin, J.C.2
  • 37
    • 0037629330 scopus 로고    scopus 로고
    • NIMBEU 0168-583X 10.1016/S0168-583X(97)00381-9
    • K. Gärtner, Nucl. Instrum. Methods Phys. Res. B NIMBEU 0168-583X 10.1016/S0168-583X(97)00381-9 132, 147 (1997).
    • (1997) Nucl. Instrum. Methods Phys. Res. B , vol.132 , pp. 147
    • Gärtner, K.1
  • 44
    • 50049091926 scopus 로고    scopus 로고
    • A. Hedler (private communication).
    • Hedler, A.1
  • 45
    • 0020098511 scopus 로고
    • JAPIAU 0021-8979 10.1063/1.331636
    • I. H. Wilson, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.331636 53, 1698 (1982).
    • (1982) J. Appl. Phys. , vol.53 , pp. 1698
    • Wilson, I.H.1
  • 48
    • 0032473725 scopus 로고    scopus 로고
    • ASUSEE 0169-4332 10.1016/S0169-4332(97)00695-8
    • Jialu Liu and Tingqing Zhang, Appl. Surf. Sci. ASUSEE 0169-4332 10.1016/S0169-4332(97)00695-8 126, 231 (1998).
    • (1998) Appl. Surf. Sci. , vol.126 , pp. 231
    • Liu, J.1    Zhang, T.2
  • 54
    • 50049117137 scopus 로고    scopus 로고
    • Ph.D. thesis, Friedrich-Schiller University
    • A. Kamarou, Ph.D. thesis, Friedrich-Schiller University, 2006.
    • (2006)
    • Kamarou, A.1
  • 55
    • 50049136127 scopus 로고    scopus 로고
    • The maximum length of the tracks visible in the figure is limited by the thickness of the thinnest (transparent to the analyzing beam of electrons) parts of the wedge shaped PV-TEM samples prepared by means of chemical etching mentioned in Sec. 2.
    • The maximum length of the tracks visible in the figure is limited by the thickness of the thinnest (transparent to the analyzing beam of electrons) parts of the wedge shaped PV-TEM samples prepared by means of chemical etching mentioned in Sec. 2.
  • 56
    • 50049113192 scopus 로고    scopus 로고
    • Otherwise no light spots were visible in Fig. 3.
    • Otherwise no light spots were visible in Fig. 3.
  • 58
    • 50049097088 scopus 로고    scopus 로고
    • Surely, the more discontinuous the ion tracks are, the less physically meaningful is their surface density, because this quantity thus depends on the thickness of the sample that can be analyzed by means of TEM.
    • Surely, the more discontinuous the ion tracks are, the less physically meaningful is their surface density, because this quantity thus depends on the thickness of the sample that can be analyzed by means of TEM.
  • 60
    • 0039527037 scopus 로고    scopus 로고
    • MSAPE3 0921-5093 10.1016/S0921-5093(98)00727-8
    • W. Bolse, Mater. Sci. Eng., A MSAPE3 0921-5093 10.1016/S0921-5093(98) 00727-8 253, 194 (1998).
    • (1998) Mater. Sci. Eng., A , vol.253 , pp. 194
    • Bolse, W.1
  • 70
    • 50049107500 scopus 로고    scopus 로고
    • www.wellesley.edu/chemistry/flick/molecules
  • 74
    • 35949027438 scopus 로고
    • RMPHAT 0034-6861 10.1103/RevModPhys.44.465
    • H.-D. Betz, Rev. Mod. Phys. RMPHAT 0034-6861 10.1103/RevModPhys.44.465 44, 465 (1972).
    • (1972) Rev. Mod. Phys. , vol.44 , pp. 465
    • Betz, H.-D.1
  • 75
    • 50049088711 scopus 로고    scopus 로고
    • The threshold value of εe for continuous track formation in Ge was estimated in Ref. to be about 46 keV/nm to 49 keV/nm.
    • The threshold value of εe for continuous track formation in Ge was estimated in Ref. to be about 46 keV/nm to 49 keV/nm.
  • 76
    • 21644462709 scopus 로고    scopus 로고
    • JAPIAU 0021-8979 10.1063/1.1938279
    • A. Kamarou, E. Wendler, and W. Wesch, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1938279 97, 123532 (2005).
    • (2005) J. Appl. Phys. , vol.97 , pp. 123532
    • Kamarou, A.1    Wendler, E.2    Wesch, W.3
  • 81
    • 50049097669 scopus 로고    scopus 로고
    • Thus, the darker regions must be either more damaged or have higher density than the rest of the track according to the first or to the second approach, respectively.
    • Thus, the darker regions must be either more damaged or have higher density than the rest of the track according to the first or to the second approach, respectively.
  • 83
    • 10844254048 scopus 로고    scopus 로고
    • JCOMEL 0953-8984 10.1088/0953-8984/16/49/R03
    • K. Trachenko, J. Phys.: Condens. Matter JCOMEL 0953-8984 10.1088/0953-8984/16/49/R03 16, R1491 (2004).
    • (2004) J. Phys.: Condens. Matter , vol.16 , pp. 1491
    • Trachenko, K.1


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