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Volumn 132, Issue 1, 1997, Pages 147-158
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Axial dechanneling in compound crystals with point defects and defect analysis by RBS
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Author keywords
Compound crystals; Dechanneling; Defect analysis; GaAs; Rutherford backscattering spectrometry; Theoretical description
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Indexed keywords
CRYSTAL ATOMIC STRUCTURE;
CRYSTAL LATTICES;
POINT DEFECTS;
RADIATION DAMAGE;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
AXIAL ION DECHANNELING;
SEMICONDUCTING GALLIUM ARSENIDE;
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EID: 0037629330
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(97)00381-9 Document Type: Article |
Times cited : (55)
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References (23)
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