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Volumn 225, Issue 1-2 SPEC. ISS., 2004, Pages 105-110

Fast heavy ion induced interface mixing in thin-film systems

Author keywords

Ion beam mixing; Swift heavy ions

Indexed keywords

DEPOSITION; ENERGY DISSIPATION; INTERFACES (MATERIALS); MIXING; SENSITIVITY ANALYSIS; THIN FILMS;

EID: 4344718527     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.04.183     Document Type: Conference Paper
Times cited : (32)

References (17)
  • 11
    • 4344594374 scopus 로고    scopus 로고
    • private communication
    • M. Toulemonde, private communication.
    • Toulemonde, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.