Re-examining the use of Network-on-Chip as test access mechanism

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2008, Pages 808-811

  Yuan, Feng ^a   Huang, Lin ^a   Xu, Qiang ^a  

^a CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

CHLORINE COMPOUNDS; COST EFFECTIVENESS; ELECTRIC NETWORK TOPOLOGY; EMBEDDED SYSTEMS; INDUSTRIAL ENGINEERING; MECHANISMS; RHENIUM;

EMBEDDED CORES; NETWORK ON CHIPS; ON-CHIP NETWORK; SYSTEM TESTING; TEST ACCESS MECHANISM; TEST CONTROL; TEST COST; TEST DATA; TEST RELIABILITY; TESTING TIME;

TESTING;

EID: 49749120586     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2008.4484917     Document Type: Conference Paper

References (16)

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