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Volumn 5, Issue 9-12, 2008, Pages 1018-1057

Nanolines on silicon surfaces

Author keywords

Electronic structure; Highly correlated systems; Nanolines; One dimensional physics; Scanning tunnelling microscopy

Indexed keywords

ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; NANOTECHNOLOGY; SCANNING TUNNELING MICROSCOPY;

EID: 49549125659     PISSN: 14757435     EISSN: None     Source Type: Journal    
DOI: 10.1504/IJNT.2008.019830     Document Type: Article
Times cited : (10)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.