Controlled fabrication of 1D molecular lines across the dimer rows on the Si(100)-(2 × 1)-H surface through the radical chain reaction

Journal of the American Chemical Society

Volumn 127, Issue 43, 2005, Pages 15030-15031

  Zakir Hossain, Md ^a   Kato, Hiroyuki S ^a   Kawai, Maki ^a,b  

^a INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIMER; HYDROGEN; NANOPARTICLE; RADICAL; SILICON; THIOL DERIVATIVE;

ADSORPTION; ARTICLE; CHEMICAL REACTION; CHEMICAL STRUCTURE; COVALENT BOND; ELECTRONICS; NANOTECHNOLOGY; RADICAL CHAIN REACTION; REACTION ANALYSIS; SCANNING TUNNELING MICROSCOPY;

EID: 27544504684     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja055515a     Document Type: Article

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