Two linear beetle-type scanning tunneling microscopes

Review of Scientific Instruments

Volumn 74, Issue 4, 2003, Pages 2429-2437

  MacLeod, J M ^a   Moffat, Antje ^a   Miwa, J A ^a   Mark, A G ^a   Mullins, G K ^a   Dumont, R H J ^a   Constant, G E ^a   McLean, A B ^a  

^a QUEEN S UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPES; SEMICONDUCTOR MATERIALS; SINGLE CRYSTALS; THERMODYNAMIC STABILITY;

CROSS-COUPLING MEASUREMENTS;

SCANNING TUNNELING MICROSCOPY;

EID: 0038003843     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1544423     Document Type: Article

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