Scanning tunneling microscopy observation of Bi-induced surface structures on the Si(100) surface

Surface Science

Volumn 482-485, Issue PART 2, 2001, Pages 1440-1444

  Naitoh, M ^a   Takei, M ^a   Nishigaki, S ^a   Oishi, N ^b   Shoji, F ^c  

^a KYUSHU INSTITUTE OF TECHNOLOGY   (Japan)

^b KUMAMOTO NATIONAL COLLEGE OF TECHNOLOGY   (Japan)

^c KYUSHU KYORITSU UNIVERSITY   (Japan)

Author keywords

Bismuth; Low index single crystal surfaces; Scanning tunneling microscopy; Silicon; Surface relaxation and reconstruction; Surface stress; Surface structure, morphology, roughness, and topography

Indexed keywords

EID: 0012962974     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)00860-3     Document Type: Article

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