Effects of high current density at nanoscale point contacts

2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008

Volumn PART A, Issue , 2008, Pages 493-502

  Lo, Hsinyi ^a   Bain, James A ^b  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Conductive AFM; Electromigration; Probe recording

Indexed keywords

APPLIED VOLTAGES; CONDUCTIVE-AFM; ELECTROMIGRATION; PROBE RECORDING;

ATOMIC FORCE MICROSCOPY; DEFORMATION; HEAT EXCHANGERS; HEAT TRANSFER; HEATING EQUIPMENT; MELTING; MICROSCOPIC EXAMINATION; PLATINUM; SILICON; THERMOANALYSIS;

GOLD;

EID: 49449093721     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/MNHT2008-52349     Document Type: Conference Paper

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