Stacking faults in quaternary InxAlyGa1-x-yN layers

Acta Materialia

Volumn 56, Issue 15, 2008, Pages 4036-4045

  Meng, F Y ^a   Rao, M ^a   Newman, N ^a   Carpenter, R ^a   Mahajan, S ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Metalorganic chemical vapor deposition (MOCVD); Nitrides; Stacking faults; Transmission electron microscopy (TEM)

Indexed keywords

STACKING FAULTS;

EID: 48449100547     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2008.04.026     Document Type: Article

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