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Journal of Applied Physics

Volumn 82, Issue 9, 1997, Pages 4296-4299

Characteristics of stacking faults in AIN thin films

(3) Dovidenko, K a Oktyabrsky, S a Narayan, J a

a North Carolina State University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000790993 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.366236 Document Type: Article

Times cited : (51)

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