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Volumn 171, Issue 1, 1999, Pages 325-339

Cathodoluminescence and transmission electron microscopy study of the influence of crystal defects on optical transitions in GaN

Author keywords

[No Author keywords available]

Indexed keywords

CATHODOLUMINESCENCE; CRYSTAL STRUCTURE; DISLOCATIONS (CRYSTALS); EPITAXIAL GROWTH; EXCITONS; NITRIDES; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0032755315     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-396X(199901)171:1<325::AID-PSSA325>3.0.CO;2-1     Document Type: Article
Times cited : (98)

References (42)
  • 3
    • 85034503725 scopus 로고    scopus 로고
    • private communication
    • S. POROWSKI, private communication.
    • Porowski, S.1
  • 31
    • 18944390342 scopus 로고    scopus 로고
    • Proc. 2nd Conf. extended defects in semiconductors, Giens (France)
    • in press
    • Y.G. SHRETER and Y.T. REBANE, Proc. 2nd Conf. Extended Defects in Semiconductors, Giens (France), 1997, J. Physique III, in press.
    • (1997) J. Physique III
    • Shreter, Y.G.1    Rebane, Y.T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.