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Volumn 23, Issue 7, 2008, Pages
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The multi-spacer patterning technique: A non-lithographic technique for terascale integration
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRON MULTIPLIERS;
ELECTRONIC PROPERTIES;
ELECTRONICS INDUSTRY;
FIELD EFFECT SEMICONDUCTOR DEVICES;
GATES (TRANSISTOR);
INTEGRATED CIRCUITS;
LITHOGRAPHY;
METALS;
MICROELECTRONICS;
MOLECULAR ELECTRONICS;
MOLECULES;
MOSFET DEVICES;
NANOTECHNOLOGY;
NONMETALS;
SEMICONDUCTING INDIUM;
SEMICONDUCTING SILICON;
SEMICONDUCTING SILICON COMPOUNDS;
SEMICONDUCTOR DEVICES;
SILICON;
TRANSISTORS;
ELECTRONIC DEVICES;
FIELD EFFECTS;
METAL-OXIDE-SEMICONDUCTOR FIELD EFFECT TRANSISTOR (MOSFET);
MOLECULAR DESIGNS;
MOLECULAR DEVICES;
NANOMETRE;
PATTERNING TECHNIQUES;
PLANAR ARRANGEMENT;
SILICON BASED DEVICES;
TERASCALE INTEGRATION;
FIELD EFFECT TRANSISTORS;
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EID: 47749098936
PISSN: 02681242
EISSN: 13616641
Source Type: Journal
DOI: 10.1088/0268-1242/23/7/075020 Document Type: Article |
Times cited : (20)
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References (35)
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