메뉴 건너뛰기




Volumn 55, Issue 3, 2008, Pages 1725-1735

Radiation tolerance of fully-depleted p-channel CCDs designed for the SNAP satellite

Author keywords

Astrophysics and space instrumentation; Radiation damage effects

Indexed keywords

ATOMS; MOSFET DEVICES; RADIATION;

EID: 45849083941     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2008.919262     Document Type: Conference Paper
Times cited : (33)

References (28)
  • 2
    • 0037251173 scopus 로고    scopus 로고
    • Fully depleted, back-illuminated charge-coupled devices fabricated on high-resistivity silicon
    • Jan
    • S. E. Holland, D. E. Groom, N. P. Palaio, R. J. Stover, and M. Wei, "Fully depleted, back-illuminated charge-coupled devices fabricated on high-resistivity silicon," IEEE Trans. Electron Dev., vol. 50, no. 1, pp. 225-238, Jan. 2003.
    • (2003) IEEE Trans. Electron Dev , vol.50 , Issue.1 , pp. 225-238
    • Holland, S.E.1    Groom, D.E.2    Palaio, N.P.3    Stover, R.J.4    Wei, M.5
  • 4
    • 33645680779 scopus 로고    scopus 로고
    • Quantum, efficiency characterization of back-illuminated CCDs Part 1: The quantum efficiency machine
    • D. E. Groom, C. J. Bebek, M. Fabricius, A. Karcher, W. F. Kolbe, N. A. Roe, and J. Steckert, "Quantum, efficiency characterization of back-illuminated CCDs Part 1: The quantum efficiency machine," SPIE, vol. 6068, pp. 133-143, 2006.
    • (2006) SPIE , vol.6068 , pp. 133-143
    • Groom, D.E.1    Bebek, C.J.2    Fabricius, M.3    Karcher, A.4    Kolbe, W.F.5    Roe, N.A.6    Steckert, J.7
  • 5
    • 33645653021 scopus 로고    scopus 로고
    • Quantum efficiency characterization of back-illuminated CCDs Part 2: Reflectivity measurements
    • M. H. Fabricius, C. J. Bebek, D. E. Groom, A. Karcher, and N. A. Roe, "Quantum efficiency characterization of back-illuminated CCDs Part 2: Reflectivity measurements," SPIE, vol. 6068, pp. 144-154, 2006.
    • (2006) SPIE , vol.6068 , pp. 144-154
    • Fabricius, M.H.1    Bebek, C.J.2    Groom, D.E.3    Karcher, A.4    Roe, N.A.5
  • 6
    • 0025842112 scopus 로고
    • The effects of proton damage on charge-coupled devices, Charge-Coupled Devices and Solid State Optical Sensors II
    • J. Janesick, G. Soli, T. Elliot, and S. Collins, "The effects of proton damage on charge-coupled devices," Charge-Coupled Devices and Solid State Optical Sensors II, SPIE, vol. 1447, pp. 87-108, 1991.
    • (1991) SPIE , vol.1447 , pp. 87-108
    • Janesick, J.1    Soli, G.2    Elliot, T.3    Collins, S.4
  • 7
    • 0034451543 scopus 로고    scopus 로고
    • Universal, damage factor for radiation-in-duced dark current in silicon devices
    • Dec
    • J. R. Srour and D. H. Lo, "Universal, damage factor for radiation-in-duced dark current in silicon devices," IEEE Trans. Nucl. Sci., vol. 47, no. 6, pt. 3, pp. 2451-2459, Dec. 2000.
    • (2000) IEEE Trans. Nucl. Sci , vol.47 , Issue.6 PART. 3 , pp. 2451-2459
    • Srour, J.R.1    Lo, D.H.2
  • 8
    • 0038382314 scopus 로고    scopus 로고
    • Review of displacement damage effects in silicon devices
    • Jun
    • J. R. Srour, C. J. Marshall, and P. W. Marshall, "Review of displacement damage effects in silicon devices," IEEE Trans. Nucl. Sci., vol. 50, no. 3, pt. 3, pp. 653-670, Jun. 2003.
    • (2003) IEEE Trans. Nucl. Sci , vol.50 , Issue.3 PART. 3 , pp. 653-670
    • Srour, J.R.1    Marshall, C.J.2    Marshall, P.W.3
  • 11
    • 0033343187 scopus 로고    scopus 로고
    • Proton damage effects on p-channel CCDs
    • Dec
    • G. R. Hopkinson, "Proton damage effects on p-channel CCDs," IEEE Trans. Nucl. Sci., vol. 46, no. 6, pp. 1790-1796, Dec. 1999.
    • (1999) IEEE Trans. Nucl. Sci , vol.46 , Issue.6 , pp. 1790-1796
    • Hopkinson, G.R.1
  • 12
    • 12744269679 scopus 로고    scopus 로고
    • Comparisons of the proton-induced dark, current and charge transfer efficiency responses of n- and p-channel CCDs
    • C. Marshall, P. W. Marshall, A. Waczynski, E. Polidan, S. J. Johnson, and A. Campbell, "Comparisons of the proton-induced dark, current and charge transfer efficiency responses of n- and p-channel CCDs," SPIE, vol. 5499, pp. 542-552, 2004.
    • (2004) SPIE , vol.5499 , pp. 542-552
    • Marshall, C.1    Marshall, P.W.2    Waczynski, A.3    Polidan, E.4    Johnson, S.J.5    Campbell, A.6
  • 15
    • 45849137027 scopus 로고    scopus 로고
    • Space Environment Information System (SPENVIS). ESA, 1997-2006 [Online]. Available: http://www.spenvis.oma.be
    • Space Environment Information System (SPENVIS). ESA, 1997-2006 [Online]. Available: http://www.spenvis.oma.be
  • 17
    • 0026953126 scopus 로고
    • A model for the field and temperature dependence of Shockley-Read-Hall lifetime in silicon
    • A. Schenk, "A model for the field and temperature dependence of Shockley-Read-Hall lifetime in silicon," Solid-State Electron., vol. 35, pp. 1585-1596, 1992.
    • (1992) Solid-State Electron , vol.35 , pp. 1585-1596
    • Schenk, A.1
  • 18
    • 0008968656 scopus 로고    scopus 로고
    • An interface state mediated junction leakage mechanism induced by a single polyhedral oxide precipitate in silicon diode
    • M. Tsuchiaki, H. Fujimori, T. Iinuma, and A. Kawasaki, "An interface state mediated junction leakage mechanism induced by a single polyhedral oxide precipitate in silicon diode," J. Appl. Phys., vol. 85, pp. 8255-8266, 1999.
    • (1999) J. Appl. Phys , vol.85 , pp. 8255-8266
    • Tsuchiaki, M.1    Fujimori, H.2    Iinuma, T.3    Kawasaki, A.4
  • 20
    • 0032047627 scopus 로고    scopus 로고
    • Charge transfer efficiency in proton damaged CCD's
    • Apr
    • T. Hardy, R. Murokowski, and M. J. Deen, "Charge transfer efficiency in proton damaged CCD's," IEEE Trans. Nucl. Sci., vol. 45, no. 2, pp. 154-163, Apr. 1998.
    • (1998) IEEE Trans. Nucl. Sci , vol.45 , Issue.2 , pp. 154-163
    • Hardy, T.1    Murokowski, R.2    Deen, M.J.3
  • 22
    • 18544363918 scopus 로고    scopus 로고
    • Anomalous annealing of a high-resistivity CCD irradiated at low temperature
    • Apr
    • M. Bautz, G. Prigozhin, S. Kissel, B. LaMarr, C. Grant, and S. Brown, "Anomalous annealing of a high-resistivity CCD irradiated at low temperature," IEEE Trans. Nucl. Sci, vol. 52, no. 2, pp. 519-526, Apr. 2005.
    • (2005) IEEE Trans. Nucl. Sci , vol.52 , Issue.2 , pp. 519-526
    • Bautz, M.1    Prigozhin, G.2    Kissel, S.3    LaMarr, B.4    Grant, C.5    Brown, S.6
  • 24
    • 12444346151 scopus 로고    scopus 로고
    • Time dependence of ACS WFC CTE corrections for photometry and future predictions,
    • ACS 2004-006, 2004 [Online, Available
    • A. Riess and J. Mack, "Time dependence of ACS WFC CTE corrections for photometry and future predictions," Instrument Science Report ACS 2004-006, 2004 [Online]. Available: http://www.stsci.edu/ hst/acs/documents/ isrs/isr0406.pdf
    • Instrument Science Report
    • Riess, A.1    Mack, J.2
  • 27
    • 0027812590 scopus 로고
    • Displacement damage effects in mixed particle environments for shielded spacecraft CCDs
    • Dec
    • C. Dale, P. Marshall, B. Cummings, L. Shamey, and A. Holland, "Displacement damage effects in mixed particle environments for shielded spacecraft CCDs," IEEE Trans. Nucl. Sci., vol. 40, no. 6, pp. 1628-1637, Dec. 1993.
    • (1993) IEEE Trans. Nucl. Sci , vol.40 , Issue.6 , pp. 1628-1637
    • Dale, C.1    Marshall, P.2    Cummings, B.3    Shamey, L.4    Holland, A.5
  • 28


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.