Proton damage effects on p-channel CCDs

IEEE Transactions on Nuclear Science

Volumn 46, Issue 6 PART 1, 1999, Pages 1790-1796

  Hopkinson, G R ^a  

^a Sira Electro Optics Ltd   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER INEFFICIENCY; DARK CURRENT EFFECTS; PROTON DAMAGE EFFECTS;

CHARGE TRANSFER; ELECTRONS; HETEROJUNCTIONS; IONIZATION; PROTONS; RADIATION DAMAGE; SEMICONDUCTOR DEVICE MANUFACTURE;

CHARGE COUPLED DEVICES;

EID: 0033343187     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.819155     Document Type: Article

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