High-voltage-compatible, fully depleted CCDs

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6276, Issue , 2006, Pages

  Holland, S E ^a   Bebek, C J ^a   Dawson, K S ^a   Emes, J H ^a   Fabricius, M H ^a   Fairfield, J A ^a   Groom, D E ^a   Karcher, A ^a   Kolbe, W F ^a   Palaio, N P ^a   Roe, N A ^a   Wang, G ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

CCD; Channel stop; Fully depleted; High voltage; PSF; Static induction transistor; X ray detection

Indexed keywords

CHANNEL STOP; FULLY DEPLETED; PSF; STATIC INDUCTION TRANSISTOR; X-RAY DETECTION;

ELECTRIC POTENTIAL; LIGHTING; THICKNESS MEASUREMENT; X RAY SPECTROSCOPY;

CHARGE COUPLED DEVICES;

EID: 33749614190     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.672393     Document Type: Conference Paper

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