Proton Nonionizing Energy Loss (NIEL) for Device Applications

IEEE Transactions on Nuclear Science

Volumn 50, Issue 6 I, 2003, Pages 1924-1928

  Jun, Insoo ^a   Xapsos, Michael A ^b   Messenger, Scott R ^c   Burke, Edward A ^d   Walters, Robert J ^e   Summers, Geoff P ^e   Jordan, Thomas ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b NASA GODDARD SPACE FLIGHT CENTER   (United States)

^c SFA INC   (United States)

^d US Naval Research Laboratory ^*

^e EMP Consultants   (United States)

Author keywords

MCNPX; Nonionizing energy loss (NIEL); Ziegler Biersack Littmark (ZBL) screened potential

Indexed keywords

COMPUTATIONAL METHODS; ELECTRIC LOSSES; ELECTRON SCATTERING; MONTE CARLO METHODS; NUCLEAR ENERGY; POTENTIAL ENERGY; REACTION KINETICS; SCREENING;

MCNPX; NONIONIZING ENERGY LOSS (NIEL); ZIEGLER-BIERSACK-LITTMARK (ZBL) SCREENED POTENTIAL;

PROTONS;

EID: 1242265278     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2003.820760     Document Type: Conference Paper

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