Near IR Continuous Wavelength Spectroscopy of Photon Emissions from Semiconductor Devices

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn 2003-November, Issue , 2003, Pages 311-316

  Len, W B ^a   Liu, Y Y ^a   Phang, J C H ^a   Chan, D S H ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; PHOTONS; SPECTROSCOPIC ANALYSIS;

EMISSION MICROSCOPES; HIGH-RESOLUTION SPECTROSCOPY; NEAR-IR; P-N JUNCTION; PHOTON EMISSIONS; SILICON BAND GAP; SPECTRA'S; WAVELENGTH RANGES;

MOSFET DEVICES;

EID: 4544369627     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.31399/asm.cp.istfa2003p0311     Document Type: Conference Paper

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