Neural network classification of photoemission spectra

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2002, Pages 205-209

  Frank, Steve ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; BACKPROPAGATION; CHARGE COUPLED DEVICES; COMPUTER SOFTWARE; DIFFRACTION GRATINGS; FAILURE ANALYSIS; INTEGRATED CIRCUITS; ION BEAMS; MOSFET DEVICES; OPTIMIZATION; PARAMETER ESTIMATION; PHOTOEMISSION; POLYSILICON; SEMICONDUCTOR DIODES; SEMICONDUCTOR JUNCTIONS; TRANSFER FUNCTIONS;

PHOTOEMISSION MICROSCOPY; PHOTOEMISSION SPECTROSCOPY;

NEURAL NETWORKS;

EID: 0036085667     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)

1. Intelligent defect localization methodology through the use of photoemission spectral analysis
2. Analysis of IDDq failures by spectral photon emission microscopy
3. Advanced method of failure analysis using photon spectrum of emission microscopy
4. Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscope
5. Neural network system for the identification of infrared spectra
6. Practical neural networks aid spectroscopic analysis
7. Spectroscopy and hybrid neural network analysis
8. Quantitative emission microscopy
9. Light emission spectral analysis: The connection between the electric field and the spectrum
10. Risk assessment in signature analysis