Picosecond imaging circuit analysis

IBM Journal of Research and Development

Volumn 44, Issue 4, 2000, Pages 583-603

  Tsang, James C ^a   Kash, Jeffrey A ^a   Vallett, David P ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b IBM MICROELECTRONICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC NETWORK ANALYSIS; ELECTRIC NETWORK SYNTHESIS; INTEGRATED CIRCUIT LAYOUT; MICROPROCESSOR CHIPS; SWITCHING CIRCUITS;

PICOSECOND IMAGING CIRCUIT ANALYSIS (PICA);

INTEGRATED CIRCUIT TESTING;

EID: 0034225231     PISSN: 00188646     EISSN: None     Source Type: Journal    
DOI: 10.1147/rd.444.0583     Document Type: Article

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