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Volumn 43, Issue 6 B, 2004, Pages 3707-3712

Laser-produced plasma light source development for extreme ultraviolet lithography

Author keywords

Collector mirror damage; EUV light source; EUV lithography; Fast ion; Laser produced plasma

Indexed keywords

COLLECTOR MIRROR DAMAGE; EUV LIGHT SOURCE; EXTREME ULTRAVIOLET LITHOGRAPHY (EUVL); FAST ION;

EID: 4444354361     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.43.3707     Document Type: Conference Paper
Times cited : (15)

References (20)
  • 1
    • 4444259413 scopus 로고    scopus 로고
    • CD file, 05-Nikon presentation-Ota.PDF (Santa Clara, February)
    • K. Ota: EUV Source Workshop, CD file, 05-Nikon presentation-Ota.PDF (Santa Clara, February. 2003).
    • (2003) EUV Source Workshop
    • Ota, K.1
  • 16
    • 4444329070 scopus 로고    scopus 로고
    • CD file, 08-Exulite presentation-Fay.pdf (Santa Clara, February)
    • B. Fay: EUV Source Workshop, CD file, 08-Exulite presentation-Fay.pdf (Santa Clara, February, 2003).
    • (2003) EUV Source Workshop
    • Fay, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.